X-ray Photoelectron Spectroscopy (XPS)

Model

K-Alpha

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Features

●   X-ray source : Al- Kα micro focused monochromator with variable spot size (50-400)µm
●  Analyzer : 180 double focusing hemispherical analyzer with 128 channel detector
●  Ion Gun : Energy range 100-4000 eV
●  Sample Size : 4-axis sample stage, 60 x 60 mm sample area, 20 mm maximum sample thickness
●   Charge Compensation : Dual beam source

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Useful for

●  Elemental composition of surface and quantification of there relative concentrations with some limitations
●  Chemical states of elements
●  Sputter depth profiling
●  High resolution chemical state spectroscopy

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Contact

Prof. Sudhansu Sharma (ssharma@iitgn.ac.in