Field Emission Scanning Electron Microscope (FE-SEM)

Model

JSM7600F (Jeol)

---

Features

●  The microscope is equipped with two modes of operation: secondary and back-scattered electron mode.
●  Energy dispersive X-ray spectroscopy (EDX – Oxford INCA Energy 250 EDS) is available for elemental analysis.
●  Resolution : 1.0 nm (15 kV), 1.5 nm (1 kV).
●  Magnification : Minimum 25x to maximum 1,000,000x.

---

Useful for

●  Estimation of particle morphology, particle size and size distribution.
●  Elemental analysis using EDX mode.
●  Estimation of morphology of micro-crack & fracture.
●  Estimation of thickness of Thin-film & Oxide layer.

---

Contact

Prof. Saumyakanti Khatua (khatuask@iitgn.ac.in)