Wafer Probe Station

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Model

Probe Station-Summit 11K (FormFactor)
Device Parameter Analyzer-B1500A Keysight and B1505 (Keysight)


Features

●   200mm ThermoChuck (electrically shielded)
●  Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
●  Patented AttoGuard® and PureLine® technologies for low leakage and low-capacitance measurements
●  Optical Microscope with Zooming Capability
●   Locking roll-out stage
●   Easy on wafer navigation
●   Temperature Range: -60'C to 300'C
●   High Resolution, Medium Power and High Power SMUs
●   LCR Meter, B1530A Waveform Generator


Useful for

●  Current - Voltage, Capacitance - Voltage Measurement
●  Semiconductor Device Electrical Characterization
●  Reliability Measurement
●  Failure Analysis


Contact

Dr. Nihar Ranjan Mohapatra (nihar@iitgn.ac.in)

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