Atomic Force Microscope (AFM)

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Model

Multimode 8(Bruker)


Features

●  Contact/Tapping mode, phase imaging.
●  Magnetic force microscopy.
●  Conducting atomic force microscopy.
●  Scanning tunnelling Microscopy.


Useful for

●  Topographic imaging, Phase modulation, Magnetic domain, Tunnelling current
●  Electrostatic force charge distribution.
●  Accurate measurement of film quality and particle size distribution.
●  Measurement of Nano-scale surface roughness.
●  High-resolution imaging of protein/peptide aggregate.
●  High-resolution imaging of chemical scaffolds.


Contact

Dr. Emila Panda (emila@iitgn.ac.in)

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