Transmission Electron Microscope (TEM)
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FEI, Themis 60-300 with EDS detector and FEI-Ceta 4k X 4k camera
Features
● FEI Titan Themis 60-300 kV. ● X-FEG high brightness gun ● New goniometer with piezo control for fine movements in x, y and z ● Super-X windowless EDX (4 quandrant SDD EDX detection; solid angle > 0.7 srad) ● 4k x 4k CMOS-based FEI CETA camera
Useful for
● Characterization of various materials.
● Process optimization.
● High resolution imaging of various molecules.
Contact
Dr. Abhay Gautam (agautam@iitgn.ac.in)