Advanced analytical FE-SEM (Jointly funded by DST-FIST and IITGN)

Model

JEOL JSM-7900F

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Features

●  High resolution scanning electron imaging
●  Backscatter electron imaging
●  Energy dispersive X-ray spectroscopy with Silicon Drift Detector (with Oxford Ultimax)
●  Wavelength dispersive X-ray spectroscopy integrated with the EDS system to offer combined EDS+WDS analysis (with Oxford Wave)
●  Electron Backscatter diffraction with 1244 x 1024 pixels resolution for micro texture measurement (with Oxford Symmetry)

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Useful for

●  Surface microstructure and feature analysis
●  High-speed elemental and crystallographic mapping

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Contact

Dr. Pradipta Ghosh (pradipta.ghosh@iitgn.ac.in)