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Central Instrumentation Facility

IIT Gandhinagar

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About CIF


The Central Instrumentation Facility (CIF) has been established with an objective of providing sophisticated characterization services to the researchers within and outside IIT Gandhinagar. The CIF houses several high-end state-of-the-art instruments. It aims to provide a central facility consisting of the latest and advanced analytical Instruments to facilitate multidisciplinary research and to cater to the needs of academic research institutes, universities, and industries for high-end material characterization.

Our Instruments


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    Advanced Analytical FE-SEM

    Surface microstructure and feature analysis, High-speed elemental and crystallographic mapping

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    Field Emission Scanning Electron Microscope (FE-SEM)

    Visualization of surface morphology, estimation of particle size and size distribution, basic elemental analysis

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    Inductively Coupled Plasma (ICP-MS)

    Heavy metal detection in various samples, detection of metals in the blood, etc.

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    Matrix Associated LASER desorption Ionization- Time of Flight (MALDI-TOF)

    Proteomics research, Bio-marker discovery

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    Liquid Chromatography-Mass spectrometer (LC-MS)

    Molecular weight information about each chromatographic peak

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    Atomic Force Microscope (AFM)

    Topographic imaging, Phase modulation, Magnetic domain, Tunnelling current

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    Single Crystal X-Ray Diffractometer (SCXRD)

    Evaluation of crystal structure of compounds

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    X-Ray Diffractometer (XRD)

    Crystallinity, crystal structure, and percent phase composition

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    Multipurpose XRD

    Powder XRD, Thin Film XRD with variable tempreture (1100°C) small angle xray scattering

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    Transmission Electron Microscope (Model: Themis 300 G3)

    Diffraction, Phase and Z contrast Imaging up to atomic length scale and EDS defectors for elemental analysis.

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    Nuclean Magnetic Resonance (NMR)

    Structural elucidation of compounds

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    Confocal Microscope

    Live cell imagining, FRET assays, Expression analysis using fluorescent probes

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    Circular Dichroism Spectrometer

    Air cooled 150W Xenon lamp, highest Signal-to-Noise ratio.

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    DLS/ZETA Sizer

    The sensitivity to measure small and dilute samples

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